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["List of OpenAccess equipments use from month 1.2014 to 3.2014","Supp_Mat_equipments-u2-all-14.xls"]
["Section","Equipment","Description","User","Start time","Time","Res. Group","Project name"]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","Co / SiO2 - obcas XPS","Adam Závodny","2014-03-06T17:00:00",7,null,4]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","Co / SiO2 - obcas XPS","Adam Závodny","2014-02-21T08:00:00",16,null,4]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","Co / ALD Al2O3 - obcas XPS","Adam Závodny","2014-03-17T08:00:00",11,null,4]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","Co / ALD Al2O3 - obcas XPS","Adam Závodny","2014-03-12T08:00:00",14,null,4]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","Co/Si","Adam Závodny","2014-02-26T17:00:00",2,null,4]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","graphene, GaN","Petr Mareš","2014-02-20T08:00:00",13,null,2]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","Co/SiO2 - islands growth-obcas XPS","Josef Polčák","2014-02-06T08:00:00",9,null,2]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","vypekani XPS","Josef Polčák","2014-02-12T08:00:00",16,null,1]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","Co/SiO2 - islands growth-obcas XPS","Josef Polčák","2014-02-05T08:00:00",9,null,2]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","Co/SiO2 - islands growth","Josef Polčák","2014-01-22T08:00:00",8,null,2]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","otevreni XPS","Josef Polčák","2014-02-11T08:00:00",16,null,1]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","Co/SiO2 - islands growth","Josef Polčák","2014-02-04T08:00:00",9,null,2]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","Co/SiO2 - islands growth","Josef Polčák","2014-01-21T08:00:00",6,null,2]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","otevreni XPS","Josef Polčák","2014-02-10T08:00:00",16,null,1]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","vypekani","Josef Polčák","2014-01-31T08:00:00",16,null,1]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","XPS BIO samples","Josef Polčák","2014-03-19T15:00:00",2,null,2]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","Co/SiO2 - islands growth","Josef Polčák","2014-01-20T10:00:00",6,null,2]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","Co/SiO2 - islands growth","Josef Polčák","2014-02-08T08:00:00",9,null,2]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","Co/SiO2 - islands growth+doplneni Co","Josef Polčák","2014-01-30T08:00:00",16,null,2]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","Co/SiO2 - XPS domereni","Josef Polčák","2014-01-11T08:00:00",1,null,8]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","Co/SiO2 - islands growth","Josef Polčák","2014-01-29T08:00:00",8,null,2]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","XPS BIO samples","Josef Polčák","2014-03-12T10:00:00",7,null,6]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","Co/SiO2 - XPS odpoledne a noc","Josef Polčák","2014-01-10T08:00:00",16,null,8]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","TDS graphene","Michal Potoček","2014-03-28T08:00:00",8,null,2]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus"," Mereni cerpaci rychlosti","Michal Potoček","2014-02-04T12:00:00",3,null,2]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","ge oxidation","Miroslav Kolíbal","2014-02-26T09:00:00",7,null,4]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","Ga dep","Miroslav Kolíbal","2014-01-17T09:00:00",3,null,2]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","Ge oxidation","Miroslav Kolíbal","2014-02-28T09:00:00",7,null,2]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","Ga dep","Miroslav Kolíbal","2014-01-16T09:00:00",3,null,2]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","Ge oxidation","Miroslav Kolíbal","2014-02-21T09:00:00",7,null,4]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","Ga oxidation","Miroslav Kolíbal","2014-01-15T11:00:00",5,null,8]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","praktikum","Miroslav Kolíbal","2014-01-31T09:00:00",5,null,8]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","Ga oxidation","Miroslav Kolíbal","2014-01-14T11:00:00",5,null,8]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","Ge nanowires","Miroslav Kolíbal","2014-01-28T11:00:00",5,null,8]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","Ga oxidation","Miroslav Kolíbal","2014-01-13T11:00:00",5,null,8]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","ALD oxides/Ge","Miroslav Kolíbal","2014-03-28T12:00:00",5,null,2]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","TiO2 nanowires","Miroslav Kolíbal","2014-01-24T09:00:00",5,null,8]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","TiO2 nanowires","Miroslav Kolíbal","2014-01-23T09:00:00",7,null,8]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","ALD SiO2","Miroslav Kolíbal","2014-01-08T09:00:00",1,null,8]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","Ga dep","Miroslav Kolíbal","2014-03-28T09:00:00",3,null,8]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","TiO2 nanowires","Miroslav Kolíbal","2014-01-22T09:00:00",7,null,8]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","ge oxidation","Miroslav Kolíbal","2014-03-18T14:00:00",3,null,2]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","Ga dep","Miroslav Kolíbal","2014-01-15T09:00:00",3,null,2]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","Ge oxidation","Miroslav Kolíbal","2014-03-11T14:00:00",3,null,4]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","Selektivni rust  GaN","Jindřich Mach","2014-02-14T08:00:00",12,null,8]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","Zmena polohy efuzni celly","Jindřich Mach","2014-01-20T08:00:00",10,null,1]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","LEIS Au spheres","Radek Duda","2014-03-11T08:00:00",3,null,2]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","LEIS Au spheres overnight","Radek Duda","2014-03-10T14:00:00",10,null,2]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","LEIS Au spheres","Radek Duda","2014-03-04T08:00:00",4,null,2]
["Fabrication/In situ characterisation","Antonín complex UHV apparatus","LEIS Au spheres overnight","Radek Duda","2014-03-03T16:00:00",8,null,2]
["Microscopy/Analysis","SPM Veeco AutoProbe CP-R I","Sidewall removing","Jiří Babocký","2014-03-27T13:00:00",4,"RG1-04",2]
["Microscopy/Analysis","SPM Veeco AutoProbe CP-R I","MFM tip test - L series","Michal Staňo","2014-03-07T12:00:00",2,"External",5]
["Microscopy/Analysis","SPM Veeco AutoProbe CP-R I","MFM L5 tip test","Michal Staňo","2014-03-06T12:00:00",2,"External",5]
["Microscopy/Analysis","SPM Veeco AutoProbe CP-R I","Transformed iron (Jonas G.)","Michal Staňo","2014-03-11T08:00:00",6,"External",5]
["Microscopy/Analysis","SPM Veeco AutoProbe CP-R I","Specialni praktikum","Michal Staňo","2014-03-06T14:00:00",2,"External",3]
["Microscopy/Analysis","SPM Veeco AutoProbe CP-R I","Semestralni projekt","Michal Staňo","2014-03-26T12:00:00",2,"External",3]
["Microscopy/Analysis","SPM Veeco AutoProbe CP-R I","Instrument transfer","Michal Staňo","2014-03-11T14:00:00",7,"External",1]
["Microscopy/Analysis","SPM Veeco AutoProbe CP-R I","Semestralni projekt","Michal Staňo","2014-03-28T13:00:00",2,"External",3]
["Microscopy/Analysis","SPM Veeco AutoProbe CP-R I","Specialni praktikum","Michal Staňo","2014-03-10T14:00:00",2,"External",3]
["Microscopy/Analysis","SPM Veeco AutoProbe CP-R I","Transformed iron (Jonas G.)","Michal Staňo","2014-03-08T08:00:00",9,"External",5]
["Microscopy/Analysis","SPM Veeco AutoProbe CP-R I","Specialni praktikum","Michal Staňo","2014-03-03T14:00:00",2,"External",3]
["Microscopy/Analysis","SPM Veeco AutoProbe CP-R I","warm-up+offset cal.","Michal Staňo","2014-02-27T08:00:00",2,"External",1]
["Microscopy/Analysis","SPM Veeco AutoProbe CP-R I","Transformed iron (Jonas G.)","Michal Staňo","2014-03-07T15:00:00",7,"External",5]
["Microscopy/Analysis","SPM Veeco AutoProbe CP-R I","MFM tips test (L1-L2)","Michal Staňo","2014-02-27T10:00:00",5,"External",5]
["Microscopy/Analysis","SNOM/SPM NT-MDT NTegra","Characterization of nanotubes","Ondřej Chmela","2014-02-12T10:00:00",9,"RG1-02",2]
["Microscopy/Analysis","SNOM/SPM NT-MDT NTegra","Characterization of PEDOT:PSS","Ondřej Chmela","2014-01-30T08:00:00",6,"RG1-02",2]
["Microscopy/Analysis","SNOM/SPM NT-MDT NTegra","Characterization of PEDOT:PSS","Ondřej Chmela","2014-01-31T09:00:00",4,"RG1-02",2]
["Microscopy/Analysis","SNOM/SPM NT-MDT NTegra","Characterization of LTCC, Parylen C, PEDOT:PSS","Ondřej Chmela","2014-01-28T10:00:00",10,"RG1-02",2]
["Microscopy/Analysis","SNOM/SPM NT-MDT NTegra","Characterization of graphene","Ondřej Chmela","2014-02-18T09:00:00",6,"RG1-02",2]
["Microscopy/Analysis","SNOM/SPM NT-MDT NTegra","Cu + SiO2","Matěj Horáček","2014-01-29T10:00:00",4,null,2]
["Microscopy/Analysis","SNOM/SPM NT-MDT NTegra","Patterned Cu foil","Matěj Horáček","2014-01-06T14:00:00",4,null,2]
["Microscopy/Analysis","SNOM/SPM NT-MDT NTegra","NaCl","Vojtěch Švarc","2014-02-03T09:00:00",4,null,2]
["Microscopy/Analysis","SNOM/SPM NT-MDT NTegra","NaCl","Vojtěch Švarc","2014-01-24T09:00:00",8,null,2]
["Microscopy/Analysis","SNOM/SPM NT-MDT NTegra","Co/SiO2 - islands growth","Josef Polčák","2014-01-24T08:00:00",1,null,2]
["Microscopy/Analysis","SNOM/SPM NT-MDT NTegra","Co/SiO2 - islands growth","Josef Polčák","2014-01-23T08:00:00",1,null,2]
["Microscopy/Analysis","SNOM/SPM NT-MDT NTegra","Co/SiO2 - islands growth","Josef Polčák","2014-01-22T08:00:00",2,null,2]
["Microscopy/Analysis","SNOM/SPM NT-MDT NTegra","Co/SiO2","Josef Polčák","2014-03-22T08:00:00",6,null,2]
["Microscopy/Analysis","SNOM/SPM NT-MDT NTegra","Co/SiO2 - islands growth","Josef Polčák","2014-02-04T12:00:00",5,null,2]
["Microscopy/Analysis","SNOM/SPM NT-MDT NTegra","Flake senzor","Miroslav Bartošík","2014-01-27T09:00:00",9,null,2]
["Microscopy/Analysis","SNOM/SPM NT-MDT NTegra","Štěpán Kovařík","Miroslav Bartošík","2014-03-28T12:00:00",2,null,2]
["Microscopy/Analysis","SNOM/SPM NT-MDT NTegra","graphene","Miroslav Bartošík","2014-01-14T08:00:00",6,null,2]
["Microscopy/Analysis","SNOM/SPM NT-MDT NTegra","SNOM and RH","Miroslav Bartošík","2014-03-17T08:00:00",4,null,2]
["Microscopy/Analysis","SNOM/SPM NT-MDT NTegra","Graphene hot acetone","Miroslav Bartošík","2014-01-08T08:00:00",4,null,2]
["Microscopy/Analysis","SNOM/SPM NT-MDT NTegra","SPM test","Miroslav Bartošík","2014-03-18T08:00:00",4,null,2]
["Litography","wet bench & spin coater Laurel 400 & centrifuge","PMMA","Jakub Sadílek","2014-03-25T16:00:00",1,null,6]
["Litography","wet bench & spin coater Laurel 400 & centrifuge","PMMA","Roman Jíra","2014-02-27T14:00:00",3,null,2]
["Litography","wet bench & spin coater Laurel 400 & centrifuge","PMMA","Markéta Kurfürstová","2014-02-05T10:00:00",1,"Open Access",4]
["Litography","wet bench & spin coater Laurel 400 & centrifuge","PMMA","Markéta Kurfürstová","2014-02-04T10:00:00",1,"Open Access",4]
["Litography","wet bench & spin coater Laurel 400 & centrifuge","PMMA","Mirek Bartoš","2014-03-21T09:00:00",6,null,2]
["Litography","wet bench & spin coater Laurel 400 & centrifuge","PMMA","Mirek Bartoš","2014-03-14T10:00:00",3,null,2]
["Litography","wet bench & spin coater Laurel 400 & centrifuge","pmma","Mirek Bartoš","2014-03-07T10:00:00",3,null,2]
["Litography","wet bench & spin coater Laurel 400 & centrifuge","PMMA","Mirek Bartoš","2014-02-28T13:00:00",3,null,2]
["Litography","wet bench & spin coater Laurel 400 & centrifuge","Spin coating- SRON","Zoltán Edes","2014-02-18T11:00:00",1,null,2]
["Litography","wet bench & spin coater Laurel 400 & centrifuge","PMMA mixing","Zoltán Edes","2014-02-03T15:00:00",1,null,2]
["Litography","wet bench & spin coater Laurel 400 & centrifuge","Spin coating","Zoltán Edes","2014-01-14T12:00:00",1,null,2]
["Litography","wet bench & spin coater Laurel 400 & centrifuge","PMMA","Jiří Babocký","2014-03-04T17:00:00",2,"RG1-04",5]
["Litography","wet bench & spin coater Laurel 400 & centrifuge","PMMA double layer","Jiří Babocký","2014-02-03T13:00:00",2,"RG1-04",5]
["Litography","wet bench & spin coater Laurel 400 & centrifuge","PMMA double layer","Jiří Babocký","2014-01-16T13:00:00",1,"RG1-04",5]
["Litography","wet bench & spin coater Laurel 400 & centrifuge","PMMA","Jiří Babocký","2014-02-18T08:00:00",1,"RG1-04",5]
["Litography","wet bench & spin coater Laurel 400 & centrifuge","PMMA","Jiří Babocký","2014-03-25T15:00:00",1,"RG1-04",2]
["Litography","wet bench & spin coater Laurel 400 & centrifuge","PMMA","Jiří Babocký","2014-03-13T13:00:00",1,"RG1-04",5]
["Litography","wet bench & spin coater Laurel 400 & centrifuge","PMMA double layer","Jiří Babocký","2014-03-11T13:00:00",2,"RG1-04",5]
["Litography","wet bench & spin coater Laurel 400 & centrifuge","PMMA","Jiří Babocký","2014-03-24T15:00:00",1,"RG1-04",5]
["Litography","wet bench & spin coater Laurel 400 & centrifuge","PMMA","Jiří Babocký","2014-02-11T11:00:00",1,"RG1-04",5]
["Litography","wet bench & spin coater Laurel 400 & centrifuge","Prebake + nanasani PMMA","Miloš Hrabovský","2014-02-19T13:00:00",3,null,2]
["Litography","wet bench & spin coater Laurel 400 & centrifuge","spincoating","Miloš Hrabovský","2014-03-12T17:00:00",2,null,2]
["Litography","wet bench & spin coater Laurel 400 & centrifuge","PMMA","Zuzana Lišková","2014-02-10T09:00:00",2,null,2]
["Litography","wet bench & spin coater Laurel 400 & centrifuge","skoleni","Zuzana Lišková","2014-03-28T10:00:00",1,null,2]
["Litography","wet bench & spin coater Laurel 400 & centrifuge","training","Zuzana Lišková","2014-01-29T09:00:00",1,null,2]
["Litography","wet bench & spin coater Laurel 400 & centrifuge","PMMA","Zuzana Lišková","2014-03-27T11:00:00",2,null,2]
["Litography","Spectroscopic reflectometer NanoCalc 2000","PMMA double layer","Jiří Babocký","2014-02-03T13:00:00",2,"RG1-04",5]
["Litography","Spectroscopic reflectometer NanoCalc 2000","PMMA","Jiří Babocký","2014-02-11T11:00:00",1,"RG1-04",5]
["Litography","Spectroscopic reflectometer NanoCalc 2000","PMMA","Jiří Babocký","2014-03-24T15:00:00",1,"RG1-04",5]
["Litography","Spectroscopic reflectometer NanoCalc 2000","testy tloustek","Zuzana Lišková","2014-03-27T11:00:00",1,null,2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","GIS","Ondřej Vyroubal","2014-02-10T15:00:00",4,null,2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","GIS","Ondřej Vyroubal","2014-03-25T16:00:00",4,null,4]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","GIS","Ondřej Vyroubal","2014-03-18T15:00:00",4,null,4]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","GIS","Ondřej Vyroubal","2014-03-13T14:00:00",4,null,4]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","GIS","Ondřej Vyroubal","2014-03-11T09:00:00",4,null,4]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","GIS","Ondřej Vyroubal","2014-03-05T12:00:00",5,null,4]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","GIS","Ondřej Vyroubal","2014-02-12T09:00:00",4,null,4]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","GIS","Ondřej Vyroubal","2014-02-11T13:00:00",4,null,4]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Co / ALD Al2O3","Adam Závodny","2014-03-16T08:00:00",6,null,4]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Co / Si islands","Adam Závodny","2014-02-23T11:00:00",6,null,4]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Co / Si","Adam Závodny","2014-02-09T10:00:00",6,null,4]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Co / Si","Adam Závodny","2014-01-30T08:00:00",1,null,4]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Co / SiO2 islands","Adam Závodny","2014-03-03T19:00:00",3,null,4]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Co / Si islands","Adam Závodny","2014-03-09T10:00:00",8,null,4]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Co islands","Adam Závodny","2014-03-30T11:00:00",5,null,4]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Tests","Jakub Sadílek","2014-03-28T12:00:00",2,null,2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","SEM SE imaging CEITEC internal","Anton Manakhov","2014-03-19T09:00:00",7,"RG1-09",6]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","SEM SE imaging CEITEC internal","Anton Manakhov","2014-02-06T09:00:00",5,"RG1-09",6]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Hap fibers","David Salamon","2014-03-26T14:00:00",3,"RG2-01",2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Hap fibers","David Salamon","2014-03-12T14:00:00",2,"RG2-01",6]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","alumina, zirconia oxides","David Salamon","2014-02-06T14:00:00",2,"RG2-01",6]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","alumina, zirconia oxides","David Salamon","2014-02-19T13:00:00",5,"RG2-01",6]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Laminaty ZrO2/Al2O3","David Salamon","2014-02-05T09:00:00",3,"RG2-01",6]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","CeO2, Alumina, Zirconia","David Salamon","2014-01-22T09:00:00",4,"RG2-01",6]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","alumina, zeria oxides","David Salamon","2014-01-16T15:00:00",3,"RG2-01",6]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","fib","Marian Márik","2014-03-25T09:00:00",7,"RG1-02",2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","fib","Marian Márik","2014-03-18T09:00:00",6,"RG1-02",2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","lamella","Marian Márik","2014-03-02T09:00:00",7,"RG1-02",2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","lamella","Marian Márik","2014-02-25T09:00:00",5,"RG1-02",2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","lamella","Marian Márik","2014-02-18T09:00:00",6,"RG1-02",2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","e beam lithography","Marian Márik","2014-01-21T10:00:00",5,"RG1-02",2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","cnt control","Marian Márik","2014-01-08T14:00:00",4,"RG1-02",2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","nanod","Marian Márik","2014-01-30T09:00:00",6,"RG1-02",2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","cnt","Marian Márik","2014-01-16T09:00:00",6,"RG1-02",2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","cnt","Marian Márik","2014-01-07T09:00:00",6,"RG1-02",2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Wet etching - Por-Si","Ondřej Metelka","2014-03-16T14:00:00",6,"Open Access",2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Wet etching - Por-Si","Ondřej Metelka","2014-03-20T14:00:00",5,"Open Access",2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Wet etching","Ondřej Metelka","2014-03-06T13:00:00",6,"Open Access",2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Wet etching","Ondřej Metelka","2014-02-27T13:00:00",5,"Open Access",2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Plasmonics","Ondřej Metelka","2014-02-05T12:00:00",3,"Open Access",2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","snom tip","Zdeněk Jakub","2014-03-20T19:00:00",2,null,2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","snom tip","Zdeněk Jakub","2014-03-11T19:00:00",2,null,2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Ge nanorods","Tomáš Pejchal","2014-03-26T17:00:00",3,null,5]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Ge nanorods","Tomáš Pejchal","2014-03-19T16:00:00",4,null,5]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Graphene","Jan Hulva","2014-02-10T19:00:00",4,null,5]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Graphene","Jan Hulva","2014-02-03T17:00:00",2,null,5]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Graphene","Jan Hulva","2014-01-31T14:00:00",4,null,5]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Graphene","Jan Hulva","2014-01-30T15:00:00",4,null,5]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Graphene","Jan Hulva","2014-02-27T16:00:00",2,null,5]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Graphene","Jan Hulva","2014-03-03T08:00:00",4,null,5]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Graphene","Jan Hulva","2014-02-06T16:00:00",3,null,5]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","PMMA double layer analysis","Jiří Babocký","2014-02-24T08:00:00",6,"RG1-04",2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Michal Staňo","Jiří Babocký","2014-03-21T19:00:00",3,"RG1-04",5]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Tomáš Pejchal","Jiří Babocký","2014-03-12T12:00:00",2,"RG1-04",2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","PMMA analysis + EBID+FIB","Jiří Babocký","2014-03-10T14:00:00",6,"RG1-04",5]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Tomáš Pejchal","Jiří Babocký","2014-03-05T17:00:00",3,"RG1-04",5]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","EDX subs","Jiří Babocký","2014-03-19T20:00:00",1,"RG1-04",2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","EBL rychla kontrola","Jiří Babocký","2014-01-15T14:00:00",1,"RG1-04",5]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Tomáš Pejchal","Jiří Babocký","2014-03-12T16:00:00",4,"RG1-04",2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Michal Stano","Jiří Babocký","2014-03-27T17:00:00",3,"RG1-04",2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","graphene, GaN","Petr Mareš","2014-01-23T15:00:00",4,null,2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","graphene, GaN","Petr Mareš","2014-03-24T08:00:00",5,null,2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","GaN nanowires","Petr Mareš","2014-01-08T18:00:00",4,null,2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","graphene, GaN","Petr Mareš","2014-03-04T09:00:00",2,null,2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","graphene, GaN","Petr Mareš","2014-02-22T10:00:00",4,null,2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","graphene, GaN","Petr Mareš","2014-02-20T18:00:00",5,null,2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","graphene, GaN","Petr Mareš","2014-02-11T18:00:00",4,null,2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","graphene, GaN - od 21:00","Petr Mareš","2014-03-20T20:00:00",4,null,2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","graphene, GaN","Petr Mareš","2014-02-04T19:00:00",5,null,2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","graphene, GaN","Petr Mareš","2014-03-06T19:00:00",4,null,2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Ceramics","Lukáš Břínek","2014-02-26T14:00:00",3,null,6]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Brinek","Lukáš Břínek","2014-01-30T19:00:00",4,null,2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Plasmonic antennas","Lukáš Břínek","2014-01-28T15:00:00",3,null,2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Antennas on membranes","Lukáš Břínek","2014-01-22T14:00:00",6,null,2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Au spheres Konecna","Lukáš Kormoš","2014-01-15T19:00:00",2,"Open Access",2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Litho grids SiO2","Miroslav Bartošík","2014-01-29T13:00:00",5,null,2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","High current lithography","Miroslav Bartošík","2014-01-21T15:00:00",6,null,2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Test dávek","Miroslav Bartošík","2014-02-18T16:00:00",3,null,2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Test","Miroslav Bartošík","2014-02-14T08:00:00",4,null,2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","EDX","Miroslav Bartošík","2014-02-07T11:00:00",1,null,2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Jonas Gloss fcc Fe","Michal Urbánek","2014-03-11T14:00:00",5,null,2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Jonas Gloss fcc Fe","Michal Urbánek","2014-03-04T14:00:00",5,null,5]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","Au spheres","Radek Duda","2014-03-24T17:00:00",7,null,2]
["Nanolithography/Nanomanipulation","Focused Ion Beam/Scanning Electron Microscope LYRA","SEM start","Stanislav Průša","2014-01-24T16:00:00",1,null,2]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","polarisation resolved PL","Dusan Hemzal","2014-01-22T08:00:00",9,"RG1-01",2]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","polarisation resolved PL","Dusan Hemzal","2014-01-21T08:00:00",9,"RG1-01",2]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","polarisation resolved PL","Dusan Hemzal","2014-02-21T08:00:00",9,"RG1-01",2]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","polarisation resolved PL","Dusan Hemzal","2014-01-20T08:00:00",9,"RG1-01",2]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","polarisation resolved PL","Dusan Hemzal","2014-02-20T08:00:00",9,"RG1-01",2]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","polarisation resolved PL","Dusan Hemzal","2014-01-16T08:00:00",9,"RG1-01",2]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","polarisation resolved PL","Dusan Hemzal","2014-02-19T08:00:00",9,"RG1-01",2]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","polarisation resolved PL","Dusan Hemzal","2014-01-15T08:00:00",9,"RG1-01",2]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","polarisation resolved PL","Dusan Hemzal","2014-02-18T08:00:00",9,"RG1-01",2]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","polarisation resolved PL","Dusan Hemzal","2014-01-14T08:00:00",9,"RG1-01",2]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","polarisation resolved PL","Dusan Hemzal","2014-02-17T08:00:00",9,"RG1-01",2]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","polarisation resolved PL","Dusan Hemzal","2014-01-13T08:00:00",9,"RG1-01",2]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD, hospodkova","Dusan Hemzal","2014-01-02T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD, hospodkova","Dusan Hemzal","2014-01-03T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","polarisation resolved PL","Dusan Hemzal","2014-01-24T08:00:00",9,"RG1-01",2]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","polarisation resolved PL","Dusan Hemzal","2014-01-23T08:00:00",9,"RG1-01",2]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-02-03T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-03-11T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-02-24T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-01-31T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-03-10T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-02-14T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-01-30T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-03-07T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-02-13T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-03-21T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-01-29T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-03-06T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-02-12T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-03-20T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-01-28T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-03-05T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-02-11T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-03-19T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-01-27T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-03-04T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-02-10T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-03-18T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD, Hospodkova","Petr Klenovsky","2014-01-10T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-03-03T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-02-07T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-03-17T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD, Hospodkova","Petr Klenovsky","2014-01-09T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-02-28T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-02-06T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-03-14T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD, Hospodkova","Petr Klenovsky","2014-01-08T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-02-27T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-02-05T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-03-13T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD, Hospodkova","Petr Klenovsky","2014-01-07T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-02-26T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-02-04T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-03-12T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD, Hospodkova","Petr Klenovsky","2014-01-06T08:00:00",8,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","QD PL Hospodkova","Petr Klenovsky","2014-02-25T08:00:00",9,"RG1-01",9]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","TERS - test interakce s laserem","Filip Munz","2014-03-27T08:00:00",10,"RG1-01",2]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","TERS - priprava opticke cesty","Filip Munz","2014-03-26T08:00:00",10,"RG1-01",2]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","TERS - priprava opticke cesty","Filip Munz","2014-03-25T08:00:00",10,"RG1-01",2]
["Optical Measurements","Scanning Probe Microscope + microRaman + PhotoLumi","TERS - vyvoj hrotu","Filip Munz","2014-03-24T12:00:00",6,"RG1-01",2]
["Microscopy/Analysis","Scanning Near-field Optical Microscopy MV 4000","Au antenky P7","Petr Dvořák","2014-02-18T10:00:00",8,null,2]
["Microscopy/Analysis","Scanning Near-field Optical Microscopy MV 4000","Single Au antenky","Petr Dvořák","2014-03-11T10:00:00",8,null,2]
["Microscopy/Analysis","Scanning Near-field Optical Microscopy MV 4000","Au antenky P7","Petr Dvořák","2014-02-20T10:00:00",8,null,2]
["Microscopy/Analysis","Scanning Near-field Optical Microscopy MV 4000","Ga na grafenu","Petr Dvořák","2014-03-13T09:00:00",4,null,2]
["Microscopy/Analysis","Scanning Near-field Optical Microscopy MV 4000","Au antenky P36","Petr Dvořák","2014-03-13T14:00:00",8,null,2]
["Microscopy/Analysis","Scanning Near-field Optical Microscopy MV 4000","Au koule on Si","Petr Dvořák","2014-02-05T14:00:00",5,null,2]
["Microscopy/Analysis","Scanning Near-field Optical Microscopy MV 4000","Au antenky P6","Petr Dvořák","2014-01-31T09:00:00",12,null,2]
["Microscopy/Analysis","Scanning Near-field Optical Microscopy MV 4000","Au antenky P36 Klement","Petr Dvořák","2014-03-14T09:00:00",7,null,2]
["Microscopy/Analysis","Scanning Near-field Optical Microscopy MV 4000","Au antenky P7 Klement","Petr Dvořák","2014-02-07T10:00:00",6,null,2]
["Microscopy/Analysis","Scanning Near-field Optical Microscopy MV 4000","Au antenky P10","Petr Dvořák","2014-01-27T09:00:00",8,null,2]
["Microscopy/Analysis","Scanning Near-field Optical Microscopy MV 4000","Single Au antenky","Petr Dvořák","2014-02-27T10:00:00",6,null,2]
["Microscopy/Analysis","Scanning Near-field Optical Microscopy MV 4000","Au antenky P7 Klement","Petr Dvořák","2014-02-06T10:00:00",6,null,2]
["Microscopy/Analysis","Scanning Near-field Optical Microscopy MV 4000","Au antenky P20","Petr Dvořák","2014-01-30T09:00:00",6,null,2]
["Microscopy/Analysis","Scanning Near-field Optical Microscopy MV 4000","Single Au antenky","Petr Dvořák","2014-02-25T09:00:00",5,null,2]
["Microscopy/Analysis","Scanning Near-field Optical Microscopy MV 4000","Test BF vs DF","Petr Dvořák","2014-02-11T10:00:00",8,null,2]
["Microscopy/Analysis","Scanning Near-field Optical Microscopy MV 4000","Servis","Petr Dvořák","2014-02-04T10:00:00",10,null,1]
["Microscopy/Analysis","Scanning Near-field Optical Microscopy MV 4000","Single Au antenky","Petr Dvořák","2014-03-04T09:00:00",5,null,2]
["Microscopy/Analysis","Scanning Near-field Optical Microscopy MV 4000","Test vlakna DUV100","Petr Dvořák","2014-02-13T11:00:00",6,null,2]
["Microscopy/Analysis","Scanning Near-field Optical Microscopy MV 4000","Servis","Petr Dvořák","2014-02-03T10:00:00",10,null,1]
["Microscopy/Analysis","Scanning Near-field Optical Microscopy MV 4000","Single Au antenky","Petr Dvořák","2014-03-06T10:00:00",6,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Plasmonics","Jiří Babocký","2014-03-05T12:00:00",5,"RG1-04",5]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Proximity function measurement","Jiří Babocký","2014-03-24T16:00:00",4,"RG1-04",5]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Kontrola EBL","Jiří Babocký","2014-03-18T14:00:00",6,"RG1-04",2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Doble layer lithography","Jiří Babocký","2014-02-06T12:00:00",8,"RG1-04",5]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Kontrola EBL (mohu posunout)","Jiří Babocký","2014-03-17T09:00:00",6,"RG1-04",5]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","EBL asymetric antennas","Jiří Babocký","2014-01-16T15:00:00",5,"RG1-04",5]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Plasmonics","Jiří Babocký","2014-03-13T15:00:00",4,"RG1-04",2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Test pro depozici Au","Jiří Babocký","2014-02-19T13:00:00",5,"RG1-04",5]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Plasmonics","Jiří Babocký","2014-02-14T12:00:00",5,"RG1-04",2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Proximity function measurement","Jiří Babocký","2014-03-25T17:00:00",3,"RG1-04",2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","PMMA undercut","Jiří Babocký","2014-03-11T15:00:00",5,"RG1-04",2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Plasmonics","Jiří Babocký","2014-02-11T13:00:00",6,"RG1-04",5]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","EBL+ sample check","Lukáš Břínek","2014-02-24T13:00:00",4,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","EBL","Lukáš Břínek","2014-02-21T08:00:00",4,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Graphene - antennas","Lukáš Břínek","2014-03-27T13:00:00",3,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","EBL-SRON","Lukáš Břínek","2014-02-18T13:00:00",5,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","EBL+ sample check","Lukáš Břínek","2014-03-25T15:00:00",2,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Sample check- zoltan","Lukáš Břínek","2014-03-14T13:00:00",3,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Antennas","Lukáš Břínek","2014-03-14T08:00:00",3,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","EBL-zoltan","Lukáš Břínek","2014-01-14T13:00:00",4,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","EBL-zoltan","Lukáš Břínek","2014-03-07T13:00:00",4,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","EBL-zoltan","Lukáš Břínek","2014-02-28T13:00:00",3,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","EBL+TiO2- Zoltan","Lukáš Břínek","2014-02-25T13:00:00",4,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","SiO2 Lithography","Jan Neuman","2014-01-06T14:00:00",5,"RG1-04",2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Si exp","Filip Ligmajer","2014-03-11T09:00:00",4,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Inspect. + Exp.","Filip Ligmajer","2014-01-27T10:00:00",3,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Si exp","Filip Ligmajer","2014-03-10T09:00:00",3,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Si exp","Filip Ligmajer","2014-03-07T10:00:00",3,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Si exp","Filip Ligmajer","2014-01-21T12:00:00",3,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Si exp","Filip Ligmajer","2014-03-04T09:00:00",4,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Si expozice","Filip Ligmajer","2014-02-24T09:00:00",3,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Si exp","Filip Ligmajer","2014-01-07T12:00:00",3,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Si expozice","Filip Ligmajer","2014-02-18T09:00:00",3,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Si exp","Filip Ligmajer","2014-02-05T09:00:00",3,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Si exp","Filip Ligmajer","2014-01-30T10:00:00",5,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Si exp","Filip Ligmajer","2014-03-25T09:00:00",4,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Stěhování v ČP - něpřístupné","Filip Ligmajer","2014-02-04T08:00:00",16,null,1]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Si exp","Filip Ligmajer","2014-03-21T09:00:00",4,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Stěhování v ČP - nepřístupné","Filip Ligmajer","2014-02-03T08:00:00",16,null,1]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Si exp","Filip Ligmajer","2014-03-12T12:00:00",2,null,8]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","Si exp","Filip Ligmajer","2014-01-29T09:00:00",3,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","EBL","Zuzana Lišková","2014-03-26T09:00:00",9,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","test","Zuzana Lišková","2014-01-27T13:00:00",5,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","EBL Hulva","Zuzana Lišková","2014-03-24T09:00:00",7,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","EBL","Zuzana Lišková","2014-03-19T09:00:00",11,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","ebl","Zuzana Lišková","2014-01-09T09:00:00",8,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","EBL","Zuzana Lišková","2014-03-06T11:00:00",6,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","EBL for graphene","Zuzana Lišková","2014-01-31T10:00:00",6,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","EBL","Zuzana Lišková","2014-02-27T11:00:00",6,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","graphene ebl","Zuzana Lišková","2014-02-20T11:00:00",6,null,2]
["Litography","Scanning Electron Microscope/e-beam writer MIRA3","kalibrace angularni intensitz, D. Skoda, T. Samori","David Škoda","2014-01-08T10:00:00",4,"Operator CF",1]
["Optical Measurements","Spectroscopic Ellipsometer V-VASE","SAM ellipsometrry","Jan Dvorak","2014-03-28T08:00:00",9,"RG1-01",2]
["Optical Measurements","Spectroscopic Ellipsometer V-VASE","SAM ellipsometrry","Jan Dvorak","2014-03-27T08:00:00",9,"RG1-01",2]
["Optical Measurements","Spectroscopic Ellipsometer V-VASE","SAM ellipsometrry","Jan Dvorak","2014-03-26T08:00:00",9,"RG1-01",2]
["Optical Measurements","Spectroscopic Ellipsometer V-VASE","SAM ellipsometrry","Jan Dvorak","2014-03-25T08:00:00",9,"RG1-01",2]
["Optical Measurements","Spectroscopic Ellipsometer V-VASE","SAM ellipsometrry","Jan Dvorak","2014-03-24T08:00:00",9,"RG1-01",2]
["Optical Measurements","Spectroscopic Ellipsometer V-VASE","SPR mereni, test cely a fluidiky","Jan Dvorak","2014-03-07T09:00:00",9,"RG1-01",2]
["Optical Measurements","Spectroscopic Ellipsometer V-VASE","SPR mereni, test cely a fluidiky","Jan Dvorak","2014-03-06T09:00:00",9,"RG1-01",2]
["Optical Measurements","Spectroscopic Ellipsometer V-VASE","SPR mereni, test cely a fluidiky","Jan Dvorak","2014-03-05T09:00:00",9,"RG1-01",2]
["Optical Measurements","Spectroscopic Ellipsometer V-VASE","SPR mereni, test cely a fluidiky","Jan Dvorak","2014-03-04T09:00:00",9,"RG1-01",2]
["Optical Measurements","Spectroscopic Ellipsometer V-VASE","SOI","Dusan Hemzal","2014-02-21T08:00:00",9,"RG1-01",6]
["Optical Measurements","Spectroscopic Ellipsometer V-VASE","SOI","Dusan Hemzal","2014-02-20T08:00:00",9,"RG1-01",6]
["Optical Measurements","Spectroscopic Ellipsometer V-VASE","kalibrace detektoru","Adam Dubroka","2014-01-22T08:00:00",10,"RG1-01",2]
["Optical Measurements","Spectroscopic Ellipsometer V-VASE","kalibrace detektoru","Adam Dubroka","2014-01-21T08:00:00",10,"RG1-01",2]
["Optical Measurements","Spectroscopic Ellipsometer V-VASE","kalibrace detektoru","Adam Dubroka","2014-01-14T08:00:00",16,"RG1-01",2]
["Optical Measurements","Spectroscopic Ellipsometer V-VASE","Tio2","Adam Dubroka","2014-01-30T08:00:00",10,"RG1-01",2]
["Optical Measurements","Vacuum FTIR Vertex80v + Hyperion 3000","DNA + antennas","Lukáš Břínek","2014-03-27T12:00:00",4,null,2]
["Packaging & Testing","Wire bonder HB 16","nanovlakna","Zuzana Lišková","2014-02-12T10:00:00",2,null,2]
["Packaging & Testing","Wire bonder HB 16","graphene","Zuzana Lišková","2014-01-24T10:00:00",1,null,2]
["Packaging & Testing","Wire bonder HB 16","grafen pro LT mereni","Zuzana Lišková","2014-02-07T10:00:00",3,null,2]
["Packaging & Testing","Wire bonder HB 16","graphene oprava kontaktů","Zuzana Lišková","2014-01-23T09:00:00",1,null,2]
["Packaging & Testing","Wire bonder HB 16","test Honza Hulva","Zuzana Lišková","2014-03-17T16:00:00",2,null,2]
["Packaging & Testing","Wire bonder HB 16","test","Zuzana Lišková","2014-02-03T10:00:00",2,null,2]
["Packaging & Testing","Wire bonder HB 16","graphene","Zuzana Lišková","2014-03-03T10:00:00",2,null,2]
["Packaging & Testing","Wire bonder HB 16","solarni clanek","Zuzana Lišková","2014-01-30T12:00:00",4,null,2]
["Packaging & Testing","Wire bonder HB 16","solarni clanek","Zuzana Lišková","2014-02-12T15:00:00",3,null,2]
["Packaging & Testing","Wire bonder HB 16","graphene oprava kontaktu","Zuzana Lišková","2014-01-13T11:00:00",1,null,2]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 3kW","kralova - vrstvy","Zdenek Spotz","2014-02-18T08:00:00",8,"RG1-05",6]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 3kW","bb-Celko","Zdenek Spotz","2014-01-08T08:00:00",8,"RG1-05",6]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 3kW","kralova - vrstvy","Zdenek Spotz","2014-02-19T08:00:00",8,"RG1-05",6]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 3kW","Pnutí - Kunz","Pavla Roupcova","2014-01-30T08:00:00",8,"RG2-05",6]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 3kW","PB-Králová","Pavla Roupcova","2014-03-13T08:00:00",8,"RG2-05",6]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 3kW","BB, PB - Pinkas","Pavla Roupcova","2014-02-13T08:00:00",8,"RG2-05",6]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 3kW","BB-různá měření","Pavla Roupcova","2014-03-14T08:00:00",10,"RG2-05",6]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 3kW","BB-různá měření, Button","Pavla Roupcova","2014-02-14T08:00:00",8,"RG2-05",6]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 3kW","Pnutí - Kunz","Pavla Roupcova","2014-02-20T08:00:00",8,"RG2-05",6]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 3kW","Kunz-pnutí","Pavla Roupcova","2014-03-27T10:00:00",6,"RG2-05",6]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 3kW","Beran","Pavla Roupcova","2014-01-24T10:00:00",6,"RG2-05",9]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 3kW","Exkurze","Pavla Roupcova","2014-03-27T08:00:00",2,"RG2-05",2]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 3kW","BB-Vavra","Pavla Roupcova","2014-01-24T08:00:00",2,"RG2-05",7]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 3kW","BB, PB - Pinkas","Pavla Roupcova","2014-01-10T08:00:00",10,"RG2-05",6]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 3kW","PB-Králová","Pavla Roupcova","2014-03-24T08:00:00",8,"RG2-05",6]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 3kW","Transmise-Vavra","Pavla Roupcova","2014-01-23T08:00:00",8,"RG2-05",7]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 3kW","BB-různá měření","Pavla Roupcova","2014-01-17T12:00:00",5,"RG2-05",6]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 3kW","BB-různá měření","Pavla Roupcova","2014-03-21T08:00:00",8,"RG2-05",6]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 3kW","BB-Beran","Pavla Roupcova","2014-01-17T08:00:00",4,"RG2-05",9]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 3kW","PB-Králová","Pavla Roupcova","2014-03-20T08:00:00",10,"RG2-05",6]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 3kW","PB-Pinkas","Pavla Roupcova","2014-01-16T08:00:00",10,"RG2-05",6]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 3kW","PB-Králová","Pavla Roupcova","2014-03-06T08:00:00",10,"RG2-05",6]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 3kW","Pnutí - Kruml","Pavla Roupcova","2014-01-31T08:00:00",8,"RG2-05",9]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 3kW","PB-Králová","Pavla Roupcova","2014-03-07T08:00:00",8,"RG2-05",6]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","GIXRD, mixtures PFP/PIC, Uni Tuebingen","Jiri Novak","2014-03-04T08:00:00",16,"RG1-01",7]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","GIXRD test, Uni Tuebingen","Jiri Novak","2014-02-20T08:00:00",15,"RG1-01",2]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","SAXS-final","Pavla Roupcova","2014-01-24T08:00:00",11,"RG2-05",6]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","SAXS - PI","Pavla Roupcova","2014-01-31T08:00:00",8,"RG2-05",7]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","SAXS-Final","Pavla Roupcova","2014-01-23T08:00:00",16,"RG2-05",6]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","Reflektivita - Turčan","Pavla Roupcova","2014-03-27T08:00:00",8,"RG2-05",6]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","Reflektivita - Turčan","Pavla Roupcova","2014-03-28T08:00:00",8,"RG2-05",6]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","mereni GaAs","Mojmir Meduna","2014-02-16T08:00:00",16,"RG1-01",7]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","GaAs mikrokrystaly","Mojmir Meduna","2014-03-23T08:00:00",15,"RG1-01",7]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","mereni GaAs","Mojmir Meduna","2014-02-15T08:00:00",16,"RG1-01",7]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","GaAs mikrokrystaly","Mojmir Meduna","2014-03-22T08:00:00",14,"RG1-01",7]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","mereni GaAs","Mojmir Meduna","2014-02-14T08:00:00",16,"RG1-01",7]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","GaAs mikrokrystaly","Mojmir Meduna","2014-03-21T08:00:00",14,"RG1-01",7]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","mereni GaAs","Mojmir Meduna","2014-02-13T08:00:00",16,"RG1-01",7]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","GaAs mikrokrystaly","Mojmir Meduna","2014-03-20T08:00:00",15,"RG1-01",7]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","mereni GaAs","Mojmir Meduna","2014-02-12T08:00:00",16,"RG1-01",7]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","GaAs mikrokrystaly","Mojmir Meduna","2014-03-16T08:00:00",14,"RG1-01",7]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","mereni GaAs","Mojmir Meduna","2014-02-11T08:00:00",16,"RG1-01",7]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","GaAs mikrokrystaly","Mojmir Meduna","2014-03-15T08:00:00",14,"RG1-01",7]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","GaAs mikrokrystaly","Mojmir Meduna","2014-03-14T08:00:00",16,"RG1-01",7]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","MQW na Ge krystalech","Mojmir Meduna","2014-03-19T08:00:00",15,"RG1-01",7]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","mereni GaAs","Mojmir Meduna","2014-02-19T08:00:00",16,"RG1-01",7]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","GaAs mikrokrystaly","Mojmir Meduna","2014-03-28T16:00:00",8,"RG1-01",7]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","mereni GaAs","Mojmir Meduna","2014-02-18T08:00:00",16,"RG1-01",7]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","GaAs mikrokrystaly","Mojmir Meduna","2014-03-30T08:00:00",15,"RG1-01",7]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","mereni GaAs","Mojmir Meduna","2014-02-17T08:00:00",16,"RG1-01",7]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","GaAs mikrokrystaly","Mojmir Meduna","2014-03-29T08:00:00",15,"RG1-01",7]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","service","Ondrej Caha","2014-01-29T08:00:00",10,"RG1-01",2]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","GaN","Ondrej Caha","2014-01-16T08:00:00",16,"RG1-01",7]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","teplotni zavislost difrakce","Ondrej Caha","2014-03-18T08:00:00",12,"RG1-01",9]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","teplotni zavislost difrakce BTO/STO","Ondrej Caha","2014-03-13T08:00:00",16,"RG1-01",9]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","teplotni zavislost difrakce BTO","Ondrej Caha","2014-03-12T08:00:00",16,"RG1-01",9]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","teplotni zavislost difrakce","Ondrej Caha","2014-03-11T08:00:00",12,"RG1-01",9]
["Microscopy/Analysis","X-ray diffractometer Rigaku SmartLab 9kW","GaN","Ondrej Caha","2014-01-17T08:00:00",12,"RG1-01",7]
["Electrical & magnetic measurements","V-A, C-V, resistance characterisation Keithley 420","PEDOT","Jiri Sedlacek","2014-03-14T08:00:00",6,"RG1-02",5]
["Electrical & magnetic measurements","V-A, C-V, resistance characterisation Keithley 420","Měření VA char","Jiri Sedlacek","2014-03-04T09:00:00",3,"RG1-02",5]
["Etching & Deposition","Atomic Layer Deposition system Fiji 200","SiO2 on Cu","Matěj Horáček","2014-01-25T10:00:00",6,null,2]
["Etching & Deposition","Atomic Layer Deposition system Fiji 200","TiO2","Michal Kern","2014-01-16T11:00:00",3,null,2]
["Etching & Deposition","Atomic Layer Deposition system Fiji 200","Al2O3 20 cysles","Jan Čechal","2014-03-21T10:00:00",3,null,4]
["Etching & Deposition","Atomic Layer Deposition system Fiji 200","SiO2 2 nm, Al2O3 2 nm/SiO2","Jan Čechal","2014-03-10T13:00:00",3,null,4]
["Etching & Deposition","Atomic Layer Deposition system Fiji 200","SiO2, Al2O3","Miroslav Kolíbal","2014-01-08T10:00:00",4,null,2]
["Etching & Deposition","Atomic Layer Deposition system Fiji 200","Al2O3, SiO2 10 cycles","Miroslav Kolíbal","2014-03-28T09:00:00",3,null,4]
["Etching & Deposition","Atomic Layer Deposition system Fiji 200","SiO2 tests","Miroslav Kolíbal","2014-01-07T09:00:00",5,null,8]
["Etching & Deposition","Atomic Layer Deposition system Fiji 200","SiO2, 200 deg, 40 c","Miroslav Kolíbal","2014-01-06T10:00:00",5,null,8]
["Chemical & thermal processes","Surface nanostructuring","deponování","Hana Kynclova","2014-03-14T08:00:00",3,"RG1-02",2]
["Chemical & thermal processes","Surface nanostructuring","Hanka depozice Au","Hana Kynclova","2014-03-07T12:00:00",3,"RG1-02",2]
["Chemical & thermal processes","Surface nanostructuring","Katka Přikrylová","Hana Kynclova","2014-03-06T09:00:00",9,"RG1-02",5]
["Chemical & thermal processes","Surface nanostructuring","Matěj anodizace","Hana Kynclova","2014-03-05T09:00:00",6,"RG1-02",2]
["Chemical & thermal processes","Surface nanostructuring","Matěj anodizace","Hana Kynclova","2014-03-03T09:00:00",6,"RG1-02",2]
["Chemical & thermal processes","Surface nanostructuring","anodizace Al","Hana Kynclova","2014-02-26T09:00:00",3,"RG1-02",2]
["Chemical & thermal processes","Surface nanostructuring","Anodizace tenkych vrstev Katka","Radim Hrdy","2014-03-18T09:00:00",8,"RG1-02",5]
["Chemical & thermal processes","Surface nanostructuring","Matej anodizace, depozice","Jana Drbohlavova","2014-03-28T08:00:00",4,"RG1-02",5]
["Chemical & thermal processes","Surface nanostructuring","Matej Dzuro - depozice, od 15 hod depozice Přikryl","Jana Drbohlavova","2014-03-26T10:00:00",10,"RG1-02",5]
["Chemical & thermal processes","Surface nanostructuring","Katka Přikrylová - Pulzní depozice","Jana Drbohlavova","2014-03-25T08:00:00",6,"RG1-02",5]
["Chemical & thermal processes","Surface nanostructuring","anodizace","Tomáš Lednický","2014-03-02T08:00:00",16,"RG1-02",5]
["Chemical & thermal processes","Surface nanostructuring","anodizace","Tomáš Lednický","2014-03-01T08:00:00",16,"RG1-02",5]